Teaching at Wake Forest
Noah P. Allen

Proposed Course Development
  • ECE 1XXX - C Programming for ECE
  • ECE 1XXX - Matlab Programming
  • ECE 1XXX - Intro to Digital and Analog Electronics
  • ECE 1XXX - Engineering Electromagnetics1
  • ECE 2XXX - Intro to Circuits and Electronics
  • ECE 2XXX - Electronics Design Lab
  • ECE 2XXX - Digital Logic
  • ECE 2XXX - Application of Embedded Systems
  • ECE 3XXX - Circuits and Electronic for Mechanical Engineers
  • ECE 3XXX - Introduction to Electrical Engineering
  • ECE 3XXX - Quantum Theory of Engineering Electronic Materials1
  • ECE 3XXX - Physics and Models of Semiconductor Devices
  • ECE 3XXX - Electrical/Electronic Circuits for Non-Major
  • ECE 3XXX - Microelectronics
  • ECE 3XXX - Semiconductor Devices
  • ECE 3XXX - Programming Digital Systems
  • ECE 3XXX - Digital Design Lab1
  • ECE 4XXX - Photovoltaic Devices1
  • ECE 4XXX - Integrated Circuit Nanomanufacturing Techniques
  • ECE 4XXX - Principles of Microfabrication Technology
  • ECE 5XXX - Nanofabrication and Nanocharacterization

1 It has been some time since using material but could ultimately be taught

Specialized Courses
Semiconductor Material/Device Characterization

Lecture-based course where students would apply theory learned in an intro. to semiconductor devices to understand how to measure and analyze real semiconductor devices such as diodes or transistors. The course would start with the basic measurement and extraction of electrical device parameters and work toward measuring and understanding possible causes of non-idealities through semiconductor material characterization. Students will come away from the course knowing the significance of specific instruments such as source-measurement units, impedance analyzers, electron microscopes, and optical components to effectively characterize semiconductor devices and materials.

Select List of Proposed Course Topics
  • Review of Basic Semiconductor Physics
  • Basic Equipment Communication and Programming
  • Electrical Characterization
    • Current-Voltage
    • Capacitance-Voltage
    • Temperature Measurements
    • Hall
  • Optical Characterization
    • Optical Equipment and Components
    • Photoluminescence
    • Steady-State Photocapacitance
  • Material Characterization
    • Atomic Force Microscopy
    • Electron Microscope (SEM and TEM)
    • X-Ray Spectroscopy (XRD, XPS)
    • Secondary Ion Mass Spectrometry (SIMS)
    • Rutherfor Backscattering

Introduction to Semiconductor Processing

Lab-based course focused on cleanroom fabrication of silicon microelectronic devices including Schottky diodes, PN diodes, MOSFETs, resistors and capacitors. Students will come away from the course understanding basic cleanroom fabrication tools and procedures including photolithography, thermal oxidation, and contact deposition. Work would be completed in small (~4-5 students) groups within the Center for Nanotechnology and Molecular Materials under the supervision of a trained graduate student.

Select List of Proposed Course Topics
  • Semiconductor Growth Methods and Wafer Creation
  • Cleanroom/Gowning Basics
  • CMOS Cleaning Process
  • Photolithography
  • Dopant Diffusion/Implantation
  • Wet/Dry Etching of Semiconductors
  • Thin Film Deposition (PVD vs CVD)
  • Wafer Die Extraction and Mounting
  • Semiconductor Device Testing

Power Semiconductor Material and Devices

Lecture-based course where students learn the device structure capabilities and limitations for power electronic devices including PIN diodes, Schottky diodes, MOSFETs, and IGBTs. This course it targeted at graduate students interested in power electronic circuits who what to understand the physical and electrical characteristics of semiconductor devices which make them suitable for high power conversion applications.

Select List of Proposed Course Topics
  • Semiconductor Physics Review
  • Critical Field Strength and Breakdown Mechanics
  • Power Electronic Device Material (Si, SiC and GaN)
  • Schottky Diode Reverse Blocking and Forward Conduction
  • P-i-N Reverse Blocking and Forward Conduction
  • Power MOSFET Devices and Topology Considerations
  • Power IGBT Devices and Topology Considerations
  • Power Thyristor Devices and Topology Considerations

[SEMINAR] Electronic Defect Characterization in Semiconductors

Present techniques on measuring and analyzing trapping defects in semiconductors by deep-level transient spectroscopy (DLTS), steady-state photocapacitance (SSPC), and photoluminescence (PL).

[SEMINAR] Cryogenic Material Characterization

Introduce concepts related to creating/maintaining a vacuum chamber and measuring semiconductor material and devices at cryogenic temperatures.

[SEMINAR] Using LabVIEW to Automate Measurements

Review LabVIEW programming methods used to communicate with newer and older research equipment to automate the measurement taking process. Some topics on data analysis and visualization would also be covered.