Teaching at CU Boulder
Noah P. Allen

Currently Offered Teachable Courses
Electrical, Computer & Energy Engineering Department
  • ECEN 1310 - C Programming for ECE
  • ECEN 1320 - Matlab Programming
  • ECEN 1400 - Intro to Digital and Analog Electronics
  • ECEN 2250 - Intro to Circuits and Electronics
  • ECEN 2260 - Circuits as Systems1
  • ECEN 2270 - Electronics Design Lab
  • ECEN 2350 - Digital Logic
  • ECEN 2440 - Application of Embedded Systems
  • ECEN 3010 - Circuits and Electronic for Mechanical Engineers
  • ECEN 3030 - Electrical/Electronic Circuits for Non-Major
  • ECEN 3250 - Microelectronics
  • ECEN 3320 - Semiconductor Devices
  • ECEN 3350 - Programming Digital Systems
  • ECEN 3360 - Digital Design Lab1
  • ECEN 4610 - Capstone Lab 1
  • ECEN 4620 - Capstone Lab 2
  • ECEN 4/5XX5 - Photovoltaic Devices1

Mechanical Engineering Department
  • MCEN 3017 - Circuits and Electronics
  • MCEN 4010 - Microsystems Integration1
  • MCEN 4115 - Mechatronics and Robotics I

1 It has been some time since using material but could ultimately be taught

Proposed Courses
Semiconductor Material/Device Characterization

Lecture-based course where students would apply theory learned in ECEN 3320 to understand how to measure and analyze real semiconductor devices such as diodes or transistors. The course would start with the basic measurement and extraction of electrical device parameters and work toward measuring and understanding possible causes of non-idealities through semiconductor material characterization. Students will come away from the course knowing the significance of specific instruments such as source-measurement units, impedance analyzers, electron microscopes, and optical components to effectively characterize semiconductor devices and materials.

Select List of Proposed Course Topics
  • Review of Basic Semiconductor Physics
  • Basic Equipment Communication and Programming
  • Electrical Characterization
    • Current-Voltage
    • Capacitance-Voltage
    • Temperature Measurements
    • Hall
  • Optical Characterization
    • Optical Equipment and Components
    • Photoluminescence
    • Steady-State Photocapacitance
  • Material Characterization
    • Atomic Force Microscopy
    • Electron Microscope (SEM and TEM)
    • X-Ray Spectroscopy (XRD, XPS)
    • Secondary Ion Mass Spectrometry (SIMS)
    • Rutherfor Backscattering

Introduction to Semiconductor Processing

Lab-based course focused on cleanroom fabrication of silicon microelectronic devices including Schottky diodes, PN diodes, MOSFETs, resistors and capacitors. Students will come away from the course understanding basic cleanroom fabrication tools and procedures including photolithography, thermal oxidation, and contact deposition. Work would be completed in small (~4-5 students) groups within the Colorado Nanofabrication Lab under the supervision of a trained graduate student.

Select List of Proposed Course Topics
  • Semiconductor Growth Methods and Wafer Creation
  • Cleanroom/Gowning Basics
  • CMOS Cleaning Process
  • Photolithography
  • Dopant Diffusion/Implantation
  • Wet/Dry Etching of Semiconductors
  • Thin Film Deposition (PVD vs CVD)
  • Wafer Die Extraction and Mounting
  • Semiconductor Device Testing

Power Semiconductor Material and Devices

Lecture-based course where students learn the device structure capabilities and limitations for power electronic devices including PIN diodes, Schottky diodes, MOSFETs, and IGBTs. This course it targeted at graduate students interested in power electronic circuits who what to understand the physical and electrical characteristics of semiconductor devices which make them suitable for high power conversion applications.

Select List of Proposed Course Topics
  • Semiconductor Physics Review
  • Critical Field Strength and Breakdown Mechanics
  • Power Electronic Device Material (Si, SiC and GaN)
  • Schottky Diode Reverse Blocking and Forward Conduction
  • P-i-N Reverse Blocking and Forward Conduction
  • Power MOSFET Devices and Topology Considerations
  • Power IGBT Devices and Topology Considerations
  • Power Thyristor Devices and Topology Considerations

[SEMINAR] Electronic Defect Characterization in Semiconductors

Present techniques on measuring and analyzing trapping defects in semiconductors by deep-level transient spectroscopy (DLTS), steady-state photocapacitance (SSPC), and photoluminescence (PL).

[SEMINAR] Cryogenic Material Characterization

Introduce concepts related to creating/maintaining a vacuum chamber and measuring semiconductor material and devices at cryogenic temperatures.

[SEMINAR] Using LabVIEW to Automate Measurements

Review LabVIEW programming methods used to communicate with newer and older research equipment to automate the measurement taking process. Some topics on data analysis and visualization would also be covered.