LabVIEW I-V and C-V Data Analysis Program

Noah Allen bio photo By Noah Allen

Problem:

Current vs Voltage (IV) and Capacitance vs Voltage (CV) data can be very helpful in determining key properties in source charge based devices such as Schottky diodes, PN diodes, and Metal-Oxide-Semiconductor (MOS) capacitors. Upon completion of a fabrication run an upward of 10 patterned samples with >140 diodes each could be yielded thus the task of measuring, analyizing and then visualizing the data became increasingly arduous especially when attempting to execute complex fitting to multiple data sets.

Solution:

After some deliberation it was decided that a program which could import and visualize data easily should be made and that coding should be done in an environment which could easily be modified by other engineers. I chose LabVIEW as the coding enviroment due to its ease of use and ability to easily interface with testing equipment though GPIB.